Technology Laser additive manufacturing: Listening for defects as they happen Andrew McCollum Dec 11, 2023 A graphic representation of the experimental setup for listening for printing defects. Credit: 2023 EPFL / Titouan…
Technology Researchers show that the sun’s energy can repair solar cell defects in the vacuum of space Andrew McCollum Jul 18, 2023 Anita Ho-Baillie and Shi Tang wear protective gloves while examining perovskite solar cell prototypes. Credit:…
Technology A strategy to reduce defects in inverted perovskite solar cells and improve their performance Andrew McCollum Jul 14, 2023 Schematic diagram showing two different crystal growth pathways of the films processed with or without the DBSO…
Technology Exploring the role of oxygen defects in a titanium dioxide protective film to maximize hydrogen… Andrew McCollum May 29, 2023 Highlighting a study on a mechanism of photoelectrochemical water splitting on Si photoanode passivated with TiOx…
Technology X-ray imaging captures fleeting defects in sodium-ion batteries Andrew McCollum May 1, 2023 BCDI scheme. a, Charging coin cell mounted on a sample stage. Focused X-rays scatter from the particles in the…
Technology Researcher develops new way to measure defects in perovskite Andrew McCollum Apr 4, 2023 Credit: Fabian Lucas Luijckx Solar energy is becoming an increasingly popular source of…
Technology Examining the influence of defects on 2D integrated electronic circuits Andrew McCollum Jan 17, 2023 Various combinations of 2D materials for the channel and insulators have been investigated for novel 2D transistors…
Technology Sensor can prevent defects in major structures from reaching costly and dangerous levels Andrew McCollum Jan 13, 2023 SEM fractographs demonstrating (a) a pore-like flaw, microcrack, and crack on the fracture surface, and (b) a…
Technology Detecting additive manufacturing defects in real-time Andrew McCollum Jan 6, 2023 A sample of additive metal manufacturing produced using a machine learning approach in combination with operando…
Technology Technique simultaneously locates multiple defects on microchip circuits Andrew McCollum Nov 4, 2022 NIST researchers have developed a technique that can simultaneously locate individual electrical flaws in multiple…